For citations:
Shlimas D.I., Kozlovskiy A.L., Kaliekperov M.E., Kadyrzhanov K.K., Uglov V.V. Study of the strength characteristics and radiation resistance of thin-film coatings based on CuX (X=Bi, Mg, Ni). Eurasian Journal of Physics and Functional Materials. 2020;4(3):234-241. https://doi.org/10.29317/ejpfm.2020040305