For citations:
Rymzhanov R.A., Zhalmagambetova A..., Ibrayeva A..., Janse Van Vuuren A..., O’Connell J.H., Skuratov V.A. MD and TEM evaluation of swift Xe ion induced latent tracks in Si3N4. Eurasian Journal of Physics and Functional Materials. 2019;3(4):363-370. https://doi.org/10.29317/ejpfm.2019030409