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Eurasian Journal of Physics and Functional Materials

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Rymzhanov R.A., Zhalmagambetova A..., Ibrayeva A..., Janse Van Vuuren A..., O’Connell J.H., Skuratov V.A. MD and TEM evaluation of swift Xe ion induced latent tracks in Si3N4. Eurasian Journal of Physics and Functional Materials. 2019;3(4):363-370. https://doi.org/10.29317/ejpfm.2019030409

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ISSN 2522-9869 (Print)
ISSN 2616-8537 (Online)